Scientific publications

E. Abad, F. Palacio, M. Nuin, A.G. de Zarate, A. Juarros, J.M. Gomez, S. Marco.

RFID smart tag for traceability and cold chain monitoring of foods: demonstration in an intercontinental fresh fish logistic chain

The main objective of this work was the validation of a RFID smart tag developed for real-time traceability and cold chain monitoring for food applications. 

Magazine/Book Journal of Food Engineering, 93, 394-399 (2009)
Date 2009
I. Vicario, C. Soriano, C. Sanz, R. Bayón y J. Leunda

Optimización del proceso de aporte de recubrimientos anticorrosión de Stellite 6 producidos mediante plaqueado láser

El plaqueado láser es una de las tecnologías de tratamiento superficial emergentes en el marco industrial actual. 

Magazine/Book Revista de metalurgia 45 (1) (2009)
Date 2009
Pages 14-19
E. Abad, B. Mazzolai, A. Juarros, D. Gomez, A. Mondini, I. Sayhan, A. Krenkow, T. Becker.

Investigation of fabrication and encapsulation processes for a flexible tag microlab

The aim of this paper is to present an integrated process flow for a smart tag with integrated sensors and RFID communication, a flexible tag microlab (FTM). 

Magazine/Book Microsystem Technologies, Micro and Nanosystems, Information Storage and Processing, 14, 527-534 (2008)
Date 2008
S. Merino, A. Retolaza, A. Juarros, H. Schift.

The influence of stamp deformation on residual layer homogeneity in thermal nanoimprint lithography

This work studies the relation between the residual layer thickness and the patterned area size, fill factor and stamp thickness for identical stamps with opposite polarity (positive and negative) made in silicon and nickel. 

Magazine/Book MicroelectronicEngineering, 85, 1892-1896 (2008)
Date 2008
E. Abad, S. Merino, A. Retolaza, A. Juarros.

Design and fabrication using nanoimprint lithography of a nanofluidic device for DNA stretching applications

In this work, we present the design and fabrication of a sealed micro/nanofluidic chip for DNA stretching applications, based on the use of the high-throughput nanoimprint lithography (NIL) technology combined with a conventional anodic bonding of the silicon base and Pyrex cover. 

Magazine/Book MicroelectronicEngineering, 85, 818-821 (2008)
Date 2008
I. Fernandez-Cuesta, X. Borrisé, A. Retolaza, S. Merino, D.A. Mendels, O. Hansen, A. Kristensen, F. Pérez-Murano.

Determination of stress build-up during nanoimprint process in triangular polymer structures

Nanoimprint process in polymers may cause internal stress accumulation in the imprinted structures that can affect their quality, leading to defects or even fatal cracks. Relaxation effects can also diminish the long term stability of the imprinted features. 

Magazine/Book MicroelectronicEngineering, 85, 838-841 (2008)
Date 2008