E. Abad, F. Palacio, M. Nuin, A.G. de Zarate, A. Juarros, J.M. Gomez, S. Marco.
RFID smart tag for traceability and cold chain monitoring of foods: demonstration in an intercontinental fresh fish logistic chain
The main objective of this work was the validation of a RFID smart tag developed for real-time traceability and cold chain monitoring for food applications.
Revista/Libro
Journal of Food Engineering, 93, 394-399 (2009)
2009I. Vicario, C. Soriano, C. Sanz, R. Bayón y J. Leunda
Optimización del proceso de aporte de recubrimientos anticorrosión de Stellite 6 producidos mediante plaqueado láser
El plaqueado láser es una de las tecnologías de tratamiento superficial emergentes en el marco industrial actual.
Revista/Libro
Revista de metalurgia 45 (1) (2009)
2009
Páginas
14-19
E. Abad, B. Mazzolai, A. Juarros, D. Gomez, A. Mondini, I. Sayhan, A. Krenkow, T. Becker.
Investigation of fabrication and encapsulation processes for a flexible tag microlab
The aim of this paper is to present an integrated process flow for a smart tag with integrated sensors and RFID communication, a flexible tag microlab (FTM).
Revista/Libro
Microsystem Technologies, Micro and Nanosystems, Information Storage and Processing, 14, 527-534 (2008)
2008S. Merino, A. Retolaza, A. Juarros, H. Schift.
The influence of stamp deformation on residual layer homogeneity in thermal nanoimprint lithography
This work studies the relation between the residual layer thickness and the patterned area size, fill factor and stamp thickness for identical stamps with opposite polarity (positive and negative) made in silicon and nickel.
Revista/Libro
MicroelectronicEngineering, 85, 1892-1896 (2008)
2008E. Abad, S. Merino, A. Retolaza, A. Juarros.
Design and fabrication using nanoimprint lithography of a nanofluidic device for DNA stretching applications
In this work, we present the design and fabrication of a sealed micro/nanofluidic chip for DNA stretching applications, based on the use of the high-throughput nanoimprint lithography (NIL) technology combined with a conventional anodic bonding of the silicon base and Pyrex cover.
Revista/Libro
MicroelectronicEngineering, 85, 818-821 (2008)
2008I. Fernandez-Cuesta, X. Borrisé, A. Retolaza, S. Merino, D.A. Mendels, O. Hansen, A. Kristensen, F. Pérez-Murano.
Determination of stress build-up during nanoimprint process in triangular polymer structures
Nanoimprint process in polymers may cause internal stress accumulation in the imprinted structures that can affect their quality, leading to defects or even fatal cracks. Relaxation effects can also diminish the long term stability of the imprinted features.
Revista/Libro
MicroelectronicEngineering, 85, 838-841 (2008)
2008